BEDFORD, Mass.--(BUSINESS WIRE)--Spire Corporation (Nasdaq: SPIR), a global solar company providing capital equipment and turn-key manufacturing lines to produce photovoltaic (PV) modules announced today the introduction of a new advanced metrology product, the Spi-EL™ Electroluminescence Solar Module Tester, at the SNEC 5th (2011) International Photovoltaic Power Generation and Exhibition in Shanghai, China.
The Spi-EL series of solar module testers use electroluminescence (EL) to identify microcracks and other invisible defects in modules. The testers utilize cooled near-infrared charge-coupled device camera technology to image each solar cell with resolutions less than 200 µm per pixel, the equivalent of a 60 megapixel image for an entire module.
The Expo, where Spire’s team members will discuss this new product, is currently taking place through February 24th at the Shanghai New International Expo Center at booth E3-003. Attending the conference is Peter DiSessa, Ed Hurley, Shih-Yuan (Andy) Lin, and Mark Little from Spire’s Sales and Marketing team.
Thursday, February 24, 2011
Subscribe to:
Post Comments (Atom)
No comments:
Post a Comment